Sheet properties measured both on-line and off-line are often expressed in arrays of values called "profiles" in cross-machine direction (CD) and "trends" in machine direction (MD). With the computing power, memory capacity, and display technology available in today's quality control and mill-wide systems, a new set of indices and two-dimensional analysis methods can be useful for better quantifying sheet quality and to provide more insights for troubleshooting sheet-making processes. 

 

Join industry experts Shin-Chin Chen (ABB) and Ian Journeaux (NewPage) in a free webinar that will summarize the commonly used VPA calculation and introduce a new set of indices for analyzing two-dimensional sheet quality measurements.Thursday, Dec. 18, 2014, from 2:00 pm – 3:00 pm (Eastern Time) For more details, visit the course registration website.